Electron microscopy and optical characterization of lattice of photonic crystals

Electron microscopy and optical characterization of lattice of photonic crystals

Musikhin, Yu.G.; Astratov, V.N.; Bert, N.A.; Bogomolov, V.N.; Kaplynskii, A.A.; Karimov, O.Z. and Vlasov, Yu.A.

A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia

Conference: Compound Semiconductors 1996. Proceedings of the Twenty-Third International Symposium on Compound Semiconductors , Page: 161-4

Editor: Shur, M.S.; Suris, R.A.

Publisher: IOP Publishing , Bristol, UK , 1997 , xxxvi+1051 Pages

Abstract: A novel family of photonic crystals were studied by transmission electron microscopy (TEM). The symmetry and orientation of the photonic lattice of a3-dimensional (3D) ordered porous silica matrix (synthetic opals) were determined. TEM study allows one to associate such crystal parameters as a long-range order and volume packing fraction with optical properties. (2 References)